We have the most advanced machines for In-Circuit Tests (ICT) using “Bed of Nails” and Flying Probe technology.
Elemaster’s Test Engineering Team has extensive expertise in developing solutions for ICT testing on bed of nails platforms such as:
Elemaster offers different testing solutions to guarantee customers the full functionality of the products and maximum reliability over time.
and on Flying Probe platforms:
The process is integrated with On-Board and Boundary Scan programming steps to ensure the highest quality of the production output.
The Boundary Scan test can be performed using different approaches:
The testing solutions offered by Elemaster are summarised in the following table:
|Parametric Testing (ICT) with flying probe||Low cost approach for low/mid volumes products manufacturing - electrical defects identification||4/6 probles flying probe testers from Spea (4040/4060)|
|Parametric Testing (ICT) with bed of nails||Medium to High volume complex products manufacturing - electrical/functional defects identification||Spea (Unitest/Easytest/3030)
|High Voltage testing (Safety)||Regulatory validation (e.g. CE, UL, CSA requirements)||Custom test benches with ABAG instrumentations|
|Cable-scan testing||Complex racks and backplanes testing||Different solution from WEEE for low /high voltage testing|
|Run In / Burn in testing||Design validation and reliability testing||High transient chambers ( +/- 20 °C/min) from -40 to +90 °C and walk in chambers|